Special parts for electron microscopes

We manufacture special parts used for electron microscopes.

Scintillators

We have the capability to produce scintillator chips for secondary electron detectors.

Sample meshes

Sample meshes for FIB equipment and TEMs can be made with materials such as Mo and Cu and in special shapes as well.

Examples of special mesh made of Mo
■ Examples of special mesh made of Mo

Grid meshes

Example of grid mesh made of SUS304
■ Example of grid mesh made of SUS304

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